TOKYO — Teradyne Inc.'s Japan Division today formally launched a new CMOS image sensor tester, which is capable of parallel testing devices with 25-MHz as the measurement frequency and data capture ...
SINGAPORE — Mixed signal and logic IC testing specialist Global Testing Corp. Ltd. (GTC) will establish an advanced CMOS image sensor testing facility at its existing site in Hsinchu, Taiwan.
As transistors are scaled to smaller dimensions, their static power increases. Combining two-dimensional (2D) channel materials with complementary metal–oxide–semiconductor (CMOS) logic architectures ...
STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...
The effort will create application-specific test solutions that are scalable and adaptable for future product lines. Related To: UTAC Holdings UTAC Holdings and AEM Holdings will collaborate and ...
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