What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...

Discover the fascinating world of static electricity through simple balloon experiments. You'll learn how static charges build up through friction, how they attract or repel objects, and see everyday ...

The secrets of the tiniest active structures in integrated circuits can be revealed using a non-destructive imaging technique, shows an international team of scientists from JKU and Keysight ...

If you enjoyed this article, I’d like to ask for your support. Scientific American has served as an advocate for science and industry for 180 years, and right now may be the most critical moment in ...

Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential. Compared to other modes ...