EDN

Rethink fault models for submicron-IC test

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...
EDN

Scan-based transition-fault test can do job

Delay-inducing defects are causing increasing concern in the semiconductor industry today, particularly at the leading-edge 130- and 90- nanometer nodes. To effectively test for such defects, the ...
Semiconductor Engineering

Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)

A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. “Chip aging may result in ...
Business Wire

Astronics Test Systems Introduces New Wire Fault Test Solution

EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...
Electronic Design

Test Point Mounted Fault Indicators

The new Fisher Pierce® TPM Series Test Point Mounted Fault Indicator from Thomas & Betts helps workers locate faulted circuits in underground distribution systems quickly. The new Fisher Pierce® TPM ...