"Although there is currently no cure, it's always an advantage to detect changes in the nerves early. Therefore, it's valuable to find a fast and safe diagnostic method," says Professor Olov ...
The LF210 Laser Autofocus System from Prior Scientific is designed to improve microscopic examination of a wide range of reflective samples including semiconductor wafers and hard disc drive platens.
THE growing demand for detailed knowledge of the constituents of cattle foods has brought into prominence the need for adequate methods of analysis. Microscopic examination affords the only certain ...
RECENTLY, the use of the electron microscope in investigating the form of fossil coccoliths has been reported by Deflandre and Fert 1, and a preliminary revision of the taxonomy has been given by ...
(AP) – Microscopic examination supports early suspicions that wear and tear caused a fan blade to snap inside one engine of a United Airlines plane that made an emergency landing shortly after takeoff ...
Amyotrophic lateral sclerosis (ALS) is a progressive neurodegenerative disease that causes the gradual loss of motor neurons in the brain and spinal cord, leading to muscle weakness, paralysis, and ...
In a fast-evolving regulatory landscape, private fund managers are facing heightened scrutiny over their cybersecurity practices. The SEC Division of Examinations' 2025 Exam Priorities, released in ...
The ferrography technique was developed in the 1970s to overcome the large particle detection deficiencies of spectrometric oil analysis. The technique is used to separate particles from fluids for ...
If you enjoyed this article, I’d like to ask for your support. Scientific American has served as an advocate for science and industry for 180 years, and right now may be the most critical moment in ...
This is a preview. Log in through your library . Oxford University Press is a department of the University of Oxford. It furthers the University's objective of excellence in research, scholarship, and ...
The LF210 Laser Autofocus System from Prior Scientific is designed to improve microscopic examination of a wide range of reflective samples including semiconductor wafers and hard disc drive platens.
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