AZoNano

Combining Flexibility and Automation in FIB-SEM for TEM Lamella Preparation

FIB-SEM enables precise, automated TEM lamella prep with expert insights from Zeiss and the Polish Academy of Sciences.
AZoNano

TEM Lamella Preparation: Combine Flexibility and Automation using the ZEISS Crossbeam FIB-SEM

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
AZOM

History of FIB Sample Preparation for TEM Analysis

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
Hosted on MSN

A New Approach to High Quality SEM Sample Preparation

A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...