Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from ...

Semiconductor engineers traditionally have focused on trying to create ‘perfect’ GDSII at tape-out, but factors such as hardware-software interactions, increasingly heterogeneous designs, and the ...

San Jose, Calif., June 5, 2002 - LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded test for integrated circuits, today announced the industry's fastest solution for at-speed silicon ...

The domain of on-chip testability and debug continues to get better. First Silicon Solutions (FS2—Lake Oswego, Oregon), a company that specializes in hardware verification and debug technologies, is ...

You all know that fixing bugs in computer chips after they've been fabricated in silicon is a tedious and costly process. This is why researchers at the University of Michigan have developed a new ...

Learn how using formal verification can take you beyond the limitations of directed-random simulation when debugging silicon. A series of case studies provide real-world usage examples of Jasper ...

Faced with the prospect of developing custom logic for a new, highly parallel processor architecture for a multimedia processor system on chip (SoC), an R&D team had to implement a strategy to ...