Read more Test Ideas and Design Ideas here. As ICs increase in complexity and decrease in size, their pin counts drop or, at best, remain constant. The result: a need for pin-saving measures like ...
Semiconductor manufacturers rely on latch-up tests to characterize ICs for susceptibility to electrical failure. Engineers can use various methods to perform latch-up tests, but the only standard that ...
Munich, Germany. Rohde & Schwarz has introduced a real-time control-interface software option for simulated radar scenarios based on pulse descriptor word (PDW) streaming. The radar scenario simulator ...
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